In situ investigation of nanometric cutting of 3C-SiC using scanning electron microscope
نویسندگان
چکیده
Experimentally revealing the nanometric deformation behavior of 3C-SiC is challenging due to its ultra-small feature size for brittle-to-ductile transition. In present work, we elucidated cutting mechanisms by performing in situ experiments under scanning electron microscope (SEM), as well post-characterization back-scattered diffraction (EBSD) and transmission microscopy (TEM). particular, a new method based on combination image processing technology SEM online observation was proposed achieve measurement force with an uncertainty less than 1 mN. Furthermore, cross-section characterized atomic (AFM) access specific energy. The results revealed that energy increase non-linearly decrease depth effect tool cutting. high-pressure phase transformation (HPPT) may play major role ductile machining parameters this experiment.
منابع مشابه
cellular behavior and scanning electron microscope evaluation of pro-root mta, root mta and modified mta on fibroblast l929
چکیده ندارد.
15 صفحه اولinvestigation of thermal comfort properties of woven sport fabric using blend of estabragh fibers
امروزه لباس در نظر ورزشکاران و کسانی که برای اوقات فراغت خود و یا برای رسیدن به اندامی متعادل، ورزش می کنند؛ بسیار با اهمیت است. احساس مطلوب از لباس در زمره خصوصیات راحتی پوشش می باشد. خصوصیات انتقال رطوبت لباس، در ارزیابی راحتی حسی و حرارتی منسوجات تولید شده از آن ها بسیار مهم است. هدف از این تحقیق، معرفی پارچه جدید است که متشکل از الیاف استبرق با خواص منحصر به فرد می باشد. استبرق لیف طبیعی تو...
the scanning electron microscope
it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...
متن کاملIn Situ Experiments in the Scanning Electron Microscope Chamber
Since the first scanning electron microscope by Knoll (1935) and theoretical developments by von Ardenne (1938a, b) in the 30’s, this imaging technique has been widely used by generations of searchers from all the scientific domains to characterize the inner structure of matter. Even if the obtained information is essential for matter description or comprehension of matter transformation, the m...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: The International Journal of Advanced Manufacturing Technology
سال: 2021
ISSN: ['1433-3015', '0268-3768']
DOI: https://doi.org/10.1007/s00170-021-07278-x